Join us for an exclusive 3 day demo tour of the FX40 AFM presented by experts from Park Systems. Discover the latest advancements and techniques in this new technology and watch a live demo and participate in conducting your own experiments on the FX40. (Be quick to secure your spot – limited number of ‘hands on’ sessions available).
FX40 AFM Demo Dates and Locations
22-24 October 2024 – (MCN) Melbourne Centre for Nanofabrication
28-30 October 2024 – Melbourne University. Materials Characterization and Fabrication Platform (MCFP)
5-6 November 2024 – University of Queensland. Centre for Microscopy and Microanalysis (CMM)
TBA November 2024 – University of New South Wales UNSW
Don’t miss this opportunity to witness and learn about the first dual-camera system ever adopted in research AFM, machine learning automation with updatable data.
FX40 Atomic Force Microscope
Auto Probe Identification
The Probe Recognition Camera reads the QR code imprinted on the chip carrier of a newly loaded probe and extracts and displays all pertinent information on each of the tips available, including the type, model, application, and usage. This enables you to select the best probe tip for each job.
Auto Probe Exchange
With automated probe exchange, users can now replace old probes easily and safely in full automation. Harnessing the convenience of an 8-probe cassette, along a magnetic controlled mechanism, probes can be mounted without the user handling them.
Auto Beam Alignment
Automatic Beam Alignment positions the SLD beam onto the proper location of a cantilever
and further optimizes the PSPD position both vertically and laterally. One simple click shifts the X,Y and Z axis for clearer images, with no distortion.