Angle Resolved Photoelectron Spectroscopy (ARPES) has emerged as the most powerful technique to understand the electronic structure of materials. The ARPES Lab maximises the advantages of the revolutionary DA30-L hemispherical high-resolution analyser and its patented in-lens deflector and electrostatic 3D focus adjustment. With the integrated cryogenic manipulator and advanced system software control, high resolution full 3D ARPES band-structures are precisely measured without sample motion.
Scienta Omicron’s DA30-L Analyser for ARPES Lab
The DA30-L XPS/UPS/ARPES analyser has an ultimate energy resolution of ≤1.8 meV and a minimum kinetic energy of ≤ 3 eV in angular resolved modes.
Scienta Omicron DA30-L hemispherical analysers pioneered the groundbreaking and now widely adopted deflector concept (international patent WO 2013/133739). With the sequential electrostatic deflection onto the analysers slit a full cone of electrons with 30Åã opening angle can be measured. This opens the opportunity for high quality band mapping of the full surface Brillouin zone without sample rotation. The deflection capability eliminates mechanical uncertainty when navigating the sample and avoids introducing angle dependent matrix element effect intensity variations.
The proprietary optical design is unique, in offering deflection mode capability with high angular resolution performance using typical excitation spot diameters (>500 micron) common in VUV sources. The energy and angular resolutions, as well as deflection range, are all achieved while using the full energy window on the detector (8% of the pass energy).
Monolayer PtSe2
Monolayer PtSe2, a new semiconducting transition-metal-dichalcogenide, epitaxially grown by direct selenization of Pt. Left: Schematic of the fabrication of PtSe2 thin films by a single step of direct selenization of a Pt(111) substrate. Right: Second-derivative spectra of the raw ARPES data.
